Texas Instruments - SN74BCT8240ANTG4

KEY Part #: K1320213

[6439PC Stock]


    Nimewo Pati:
    SN74BCT8240ANTG4
    Manifakti:
    Texas Instruments
    Detaye deskripsyon:
    IC SCAN TEST DEVICE BUFF 24-DIP.
    Manufacturer's standard lead time:
    Nan stok
    Lavi etajè:
    Yon ane
    Chip Soti nan:
    Hong Kong
    RoHS:
    Metòd peman:
    Chemen chajman:
    Kategori Fanmi yo:
    KEY Composants Co., LTD se yon Distribitè Eleman Elektwonik ki ofri kategori pwodwi ki gen ladan: PMIC - Chofè Gate, Embedded - PLDs (Pwogramasyon lojik Aparèy), Embedded - FPGAs (Field Programmable Gate Array) a, Lineyè - Anplifikatè - Amps Videyo ak Modil yo, Entèfas - Contrôleur, PMIC - PFC (Koreksyon faktè pouvwa), Objektif Audio espesyal and Entèfas - switch analog, multiplexeurs, Demultiple ...
    Avantaj konpetitif:
    We specialize in Texas Instruments SN74BCT8240ANTG4 electronic components. SN74BCT8240ANTG4 can be shipped within 24 hours after order. If you have any demands for SN74BCT8240ANTG4, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8240ANTG4 Atribi pwodwi yo

    Nimewo Pati : SN74BCT8240ANTG4
    Manifakti : Texas Instruments
    Deskripsyon : IC SCAN TEST DEVICE BUFF 24-DIP
    Seri : 74BCT
    Estati Pati : Obsolete
    Tip lojik : Scan Test Device with Inverting Buffers
    Pwovizyon pou Voltage : 4.5V ~ 5.5V
    Kantite Bits : 8
    Operating Tanperati : 0°C ~ 70°C
    Mounting Kalite : Through Hole
    Pake / Ka : 24-DIP (0.300", 7.62mm)
    Pake Aparèy Founisè : 24-PDIP