Nimewo Pati :
SN74BCT8240ADWR
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN TEST DEVICE BUFF 24-SOIC
Tip lojik :
Scan Test Device with Inverting Buffers
Pwovizyon pou Voltage :
4.5V ~ 5.5V
Operating Tanperati :
0°C ~ 70°C
Mounting Kalite :
Surface Mount
Pake / Ka :
24-SOIC (0.295", 7.50mm Width)
Pake Aparèy Founisè :
24-SOIC