[6496PC Stock]
- Nimewo Pati:
- SN74BCT8373ADWRE4
- Manifakti:
- Texas Instruments
- Detaye deskripsyon:
- IC SCAN TEST DEVICE LATCH 24SOIC.
- Manufacturer's standard lead time:
- Nan stok
- Lavi etajè:
- Yon ane
- Chip Soti nan:
- Hong Kong
- RoHS:
- Metòd peman:
-
- Chemen chajman:
- Kategori Fanmi yo:
- KEY Composants Co., LTD se yon Distribitè Eleman Elektwonik ki ofri kategori pwodwi ki gen ladan: Embedded - FPGAs (Field Programmable Gate Array) a, Memwa - regulateur, PMIC - regilatè Voltage - lineyè + oblije chanje, Entèfas - UARTs (Transmetè Inivèsèl Reseptè Asenkr, Lineyè - Comparators, PMIC - regilatè Voltage - DC DC otomatik regilatè, Akizisyon Done - Analog pou Digital Convertisseurs and Lojik - Gates ak Inverters - Multi-Fonksyon, confi ...
- Avantaj konpetitif:
- We specialize in Texas Instruments SN74BCT8373ADWRE4 electronic components. SN74BCT8373ADWRE4 can be shipped within 24 hours after order. If you have any demands for SN74BCT8373ADWRE4, Please submit a Request for Quotation here or send us an email: rfq@key-components.com
SN74BCT8373ADWRE4 Atribi pwodwi yo
Nimewo Pati :
SN74BCT8373ADWRE4
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN TEST DEVICE LATCH 24SOIC
Seri :
74BCT
Estati Pati :
Obsolete
Tip lojik :
Scan Test Device with D-Type Latches
Pwovizyon pou Voltage :
4.5V ~ 5.5V
Kantite Bits :
8
Operating Tanperati :
0°C ~ 70°C
Mounting Kalite :
Surface Mount
Pake / Ka :
24-SOIC (0.295", 7.50mm Width)
Pake Aparèy Founisè :
24-SOIC
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