Nimewo Pati :
SN74ABT18640DGGR
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN-TEST-DEV/TXRX 56-TSSOP
Tip lojik :
Scan Test Device with Inverting Bus Transceivers
Pwovizyon pou Voltage :
4.5V ~ 5.5V
Operating Tanperati :
-40°C ~ 85°C
Mounting Kalite :
Surface Mount
Pake / Ka :
56-TFSOP (0.240", 6.10mm Width)
Pake Aparèy Founisè :
56-TSSOP