Nimewo Pati :
SN74LVTH18502APMG4
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tip lojik :
ABT Scan Test Device With Universal Bus Transceivers
Pwovizyon pou Voltage :
2.7V ~ 3.6V
Operating Tanperati :
-40°C ~ 85°C
Mounting Kalite :
Surface Mount
Pake Aparèy Founisè :
64-LQFP (10x10)