Nimewo Pati :
SN74BCT8244ANT
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN TEST DEVICE BUFF 24-DIP
Tip lojik :
Scan Test Device with Buffers
Pwovizyon pou Voltage :
4.5V ~ 5.5V
Operating Tanperati :
0°C ~ 70°C
Mounting Kalite :
Through Hole
Pake / Ka :
24-DIP (0.300", 7.62mm)
Pake Aparèy Founisè :
24-PDIP