Texas Instruments - SN74BCT8374ADWRG4

KEY Part #: K1320046

[7800PC Stock]


    Nimewo Pati:
    SN74BCT8374ADWRG4
    Manifakti:
    Texas Instruments
    Detaye deskripsyon:
    IC SCAN TEST DEVICE 24SOIC.
    Manufacturer's standard lead time:
    Nan stok
    Lavi etajè:
    Yon ane
    Chip Soti nan:
    Hong Kong
    RoHS:
    Metòd peman:
    Chemen chajman:
    Kategori Fanmi yo:
    KEY Composants Co., LTD se yon Distribitè Eleman Elektwonik ki ofri kategori pwodwi ki gen ladan: Memwa - Batri, PMIC - regilatè Voltage - DC DC oblije chanje regu, Entèfas - Contrôleur, Lojik - Flip Flops, PMIC - regilatè Voltage - lineyè + oblije chanje, PMIC - Pouvwa sou Ethernet (PoE) regulateur, PMIC - Enèji Metering and Memwa - regulateur ...
    Avantaj konpetitif:
    We specialize in Texas Instruments SN74BCT8374ADWRG4 electronic components. SN74BCT8374ADWRG4 can be shipped within 24 hours after order. If you have any demands for SN74BCT8374ADWRG4, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8374ADWRG4 Atribi pwodwi yo

    Nimewo Pati : SN74BCT8374ADWRG4
    Manifakti : Texas Instruments
    Deskripsyon : IC SCAN TEST DEVICE 24SOIC
    Seri : 74BCT
    Estati Pati : Obsolete
    Tip lojik : Scan Test Device with D-Type Edge-Triggered Flip-Flops
    Pwovizyon pou Voltage : 4.5V ~ 5.5V
    Kantite Bits : 8
    Operating Tanperati : 0°C ~ 70°C
    Mounting Kalite : Surface Mount
    Pake / Ka : 24-SOIC (0.295", 7.50mm Width)
    Pake Aparèy Founisè : 24-SOIC