Nimewo Pati :
SN74ABTH182652APM
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN TEST DEVICE 18BIT 64LQFP
Tip lojik :
Scan Test Device With Transceivers And Registers
Pwovizyon pou Voltage :
4.5V ~ 5.5V
Operating Tanperati :
-40°C ~ 85°C
Mounting Kalite :
Surface Mount
Pake Aparèy Founisè :
64-LQFP (10x10)