Texas Instruments - SN74BCT8374ADWR

KEY Part #: K1320204

[6512PC Stock]


    Nimewo Pati:
    SN74BCT8374ADWR
    Manifakti:
    Texas Instruments
    Detaye deskripsyon:
    IC SCAN TEST DEVICE W/FF 24-SOIC.
    Manufacturer's standard lead time:
    Nan stok
    Lavi etajè:
    Yon ane
    Chip Soti nan:
    Hong Kong
    RoHS:
    Metòd peman:
    Chemen chajman:
    Kategori Fanmi yo:
    KEY Composants Co., LTD se yon Distribitè Eleman Elektwonik ki ofri kategori pwodwi ki gen ladan: Revèy / Distribisyon - Revèy Tan Reyèl, PMIC - Lighting, Ballast regulateur, Lojik - Kontè yo, Divizeur yo, Entèfas - Contrôleur, Embedded - CPLDs (Aparèy lojik Pwogramè konplèks), Entèfas - switch analog, multiplexeurs, Demultiple, Revèy / Distribisyon - Aplikasyon espesifik and Lojik - Gates ak Inverters - Multi-Fonksyon, confi ...
    Avantaj konpetitif:
    We specialize in Texas Instruments SN74BCT8374ADWR electronic components. SN74BCT8374ADWR can be shipped within 24 hours after order. If you have any demands for SN74BCT8374ADWR, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8374ADWR Atribi pwodwi yo

    Nimewo Pati : SN74BCT8374ADWR
    Manifakti : Texas Instruments
    Deskripsyon : IC SCAN TEST DEVICE W/FF 24-SOIC
    Seri : 74BCT
    Estati Pati : Obsolete
    Tip lojik : Scan Test Device with D-Type Edge-Triggered Flip-Flops
    Pwovizyon pou Voltage : 4.5V ~ 5.5V
    Kantite Bits : 8
    Operating Tanperati : 0°C ~ 70°C
    Mounting Kalite : Surface Mount
    Pake / Ka : 24-SOIC (0.295", 7.50mm Width)
    Pake Aparèy Founisè : 24-SOIC