Nimewo Pati :
SN74LVTH182512DGGR
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN-TEST-DEV/XCVR 64-TSSOP
Tip lojik :
ABT Scan Test Device With Universal Bus Transceivers
Pwovizyon pou Voltage :
2.7V ~ 3.6V
Operating Tanperati :
-40°C ~ 85°C
Mounting Kalite :
Surface Mount
Pake / Ka :
64-TFSOP (0.240", 6.10mm Width)
Pake Aparèy Founisè :
64-TSSOP