Nimewo Pati :
SN74ABT8543DWRE4
Manifakti :
Texas Instruments
Deskripsyon :
IC SCAN TEST DEVICE 28-SOIC
Tip lojik :
Scan Test Device with Registered Bus Transceiver
Pwovizyon pou Voltage :
4.5V ~ 5.5V
Operating Tanperati :
-40°C ~ 85°C
Mounting Kalite :
Surface Mount
Pake / Ka :
28-SOIC (0.295", 7.50mm Width)
Pake Aparèy Founisè :
28-SOIC