Texas Instruments - SN74ABT8543DWRE4

KEY Part #: K1320181

[6699PC Stock]


    Nimewo Pati:
    SN74ABT8543DWRE4
    Manifakti:
    Texas Instruments
    Detaye deskripsyon:
    IC SCAN TEST DEVICE 28-SOIC.
    Manufacturer's standard lead time:
    Nan stok
    Lavi etajè:
    Yon ane
    Chip Soti nan:
    Hong Kong
    RoHS:
    Metòd peman:
    Chemen chajman:
    Kategori Fanmi yo:
    KEY Composants Co., LTD se yon Distribitè Eleman Elektwonik ki ofri kategori pwodwi ki gen ladan: PMIC - switch distribisyon pouvwa, chofè chaj, Entèfas - Serializers, Deserializers, Lojik - Siyal switch, multiplexeurs, Decoder, Embedded - Sistèm Sou Chip (SoC), PMIC - contrôles cho echanj, Entèfas - sensor, kapasitif Touch, Memwa and Lineyè - multiplikatè analog, divizeur ...
    Avantaj konpetitif:
    We specialize in Texas Instruments SN74ABT8543DWRE4 electronic components. SN74ABT8543DWRE4 can be shipped within 24 hours after order. If you have any demands for SN74ABT8543DWRE4, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74ABT8543DWRE4 Atribi pwodwi yo

    Nimewo Pati : SN74ABT8543DWRE4
    Manifakti : Texas Instruments
    Deskripsyon : IC SCAN TEST DEVICE 28-SOIC
    Seri : 74ABT
    Estati Pati : Obsolete
    Tip lojik : Scan Test Device with Registered Bus Transceiver
    Pwovizyon pou Voltage : 4.5V ~ 5.5V
    Kantite Bits : 8
    Operating Tanperati : -40°C ~ 85°C
    Mounting Kalite : Surface Mount
    Pake / Ka : 28-SOIC (0.295", 7.50mm Width)
    Pake Aparèy Founisè : 28-SOIC